A highly scalable mixed-signal test system offering higher throughput, improved accuracy, and broader application coverage for modern ICs.
All-in-One Test Head
Combines analog VI, AC signal
sources, and digital channels for easy setup.
High-Channel Density
36 slots for flexible analog and digital
configurations.
High-Power Testing
Tests up to ±1000V and ±100A with precision of 16-bit resolution.
Multi-Parallelism
Optimized for testing multiple devices at once, speeding up production.
Simplified Design
Internal fan-out resources reduce load board complexity.
